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2601B-PULSE System SourceMeter® 10 μsec Pulser/SMU Instrument | Tektronix

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2601B-PULSE System SourceMeter® 10 μsec Pulser/SMU Instrument | Tektronix Toggle Search Current Language × English

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Tektronix Products Keithley Instruments & Products Keithley Source Measure Units 2601B-PULSE System SourceMeter® 10 μsec Pulser/SMU Instrument 2601B-PULSE 10 µsec Pulser/SMU The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test. Base Price US $20,500 + Select Model to Configure/Quote Datasheet Manual Downloads Channels 1 Pulser / 1 SMU

Pulser V/I Range 1 μA - 10 A
1 μV - 10 V

SMU V/I Range 100 fA - 10 A
100 nV - 40 V

Accuracy Pulser: 0.05%
SMU: 0.015%

Max Speed 1 M readings/s

2601B-Pulse  SourceMeter Overview Models Applications Software Accessories Technical Docs Achieve high pulse fidelity without manual pulse tuning The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times Output 10 A @ 10 V with a 10 μs pulse width Pulse rise time High fidelity pulse output without tuning at any current level Incorporates the functionality of a fast pulser and SMU in one instrument The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.

Pulser 0.05% basic measure accuracy with 1 MS/s digitizing SMU 100 nA low current range with 100 fA sensitivity Rear panel BNC connections for quick cable setup Embedded scripting and connectivity for unmatched production throughput Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.

Eliminates time-consuming bus communications to and from the PC Advanced data processing and flow control Connect up to 32 TSP-Link nodes Reconfigure easily as test requirements change Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price Configure And Quote 2601B-PULSE 1 10 A 40 V 100 fA / 100 nV Pulser: 100 W instantaneous
SMU: 200 W instantaneous US $20,500 Configure & Quote Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price Configure And Quote 2601B-PULSE 1 10 A 40 V 100 fA / 100 nV Pulser: 100 W instantaneous
SMU: 200 W instantaneous US $20,500 Configure & Quote Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.

Programmable pulse current source up to 10 A and 10 µs pulse widths Voltage and current measure resolution at 100 nV and 100 fA Built-in TSP® processing capability reduces PC-instrument bus communication

How to generate 10μs pulse with 2601B-PULSE System SourceMeter Pulse SMU Instrument
New Current Pulser / SMU Eliminates Time Consuming Manual Timing when Outputting Pulses as Low as 10 µs

Failure Analysis and Quality Assurance Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail to prevent them in the field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why a device failed and how it can be prevented in the future.

Streamline FA processes with SMU and Pulse testing Digital I/O to trigger external IR cameras Built-in timer function with 1 μs resolution and ±100 ppm accuracy.

Advancing Techniques of Failure Analysis Using Source Measure Units and Lock-in Thermography

Simplified Pulsed/DC I/V Characterization of LEDs The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.

Programmable current source up to 10 A and 10 µs pulse widths Voltage and current measure resolution at 100 nV and 100 fA 1 Megasample/second digitizers for fast source and measure data collection Built-in TSP processing capability reduces PC-instrument bus communication On Wafer Semiconductor Testing Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.

Built-in TSP processing capability reduces PC-instrument bus communication TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments Keithley KickStart Instrument Control Software. No Programming Required. Making measurements is easy with KickStart. Characterize your devices and materials quickly and easily without programming. Visualize real-time results in graphical and tabular format. Export data tables or graphs for quick reporting or additional analysis in Excel.

Create single or sweep pulse tests quickly Generate linear, log, list, and dual sweeps of voltage and current source with simultaneous measurement I-V characterization application to support up to 4 source measure unit (SMU) instruments GPIB, USB, Ethernet connectivity on Windows OS

Download KickStart today and try it out
Keithley KickStart Datasheet

Automated Control from Lab to Fab Keithley's Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench, or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric test, reliability test, and simple functional test.

Perform simple 1-off tests or build complex project trees Code with Python inside ACS for unlimited flexibility and control Manual or automated wafer prober control Data management and statistical analysis capabilities Start Automating

TSP Toolkit Scripting Tool TSP Toolkit is an open source scripting tool available as a Visual Studio Code (VS Code) extension. It can be used to develop TSP test scripts alongside your other favorite VS Code extensions, such as those for Python, C# and many more.

TSP Toolkit includes all the functionality and instrument support of Test Script Builder (TSB) plus many quality-of-life features including syntax highlighting, auto-completion with in-line command help, and a modern user interface.

Learn More

Accessory 2600-BAN Datasheet / Manual Description View Datasheet BANANA JACK INTERFACE CABLE Accessory 2600-KIT Datasheet / Manual Description View Datasheet 2600 SERIES SCREW TERMINAL CONNECTOR KIT Accessory 2601B-PULSE-CA1 Datasheet / Manual Description View Datasheet 2601B-PULSE 1.2 meter 50 Ohm BNC to BNC cable kit Accessory 2601B-PULSE-CA2 Datasheet / Manual Description View Datasheet 2601B-PULSE 3 meter 50 Ohm BNC to BNC cable kit Accessory 2601B-PULSE-CA3 Datasheet / Manual Description View Datasheet 2601B-PULSE 3.0 meter 15 Ohm BNC to BNC cable kit Accessory 4299-1 Datasheet / Manual Description View Datasheet HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT Accessory 4299-2 Datasheet / Manual Description View Datasheet HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS Accessory 7078-TRX-GND Datasheet / Manual Description View Datasheet 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED) Accessory 8101-PIV Datasheet / Manual Description View Datasheet PIV DEMO FIXTURE Accessory KPCI-488LPA Datasheet / Manual Description View Datasheet LOW PROFILE IEEE-488 INTERFACE BOARD Accessory KUSB-488B Datasheet / Manual Description View Datasheet IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER Datasheet / Manual Accessory Description View Datasheet 2600-BAN BANANA JACK INTERFACE CABLE View Datasheet 2600-KIT 2600 SERIES SCREW TERMINAL CONNECTOR KIT View Datasheet 2601B-PULSE-CA1 2601B-PULSE 1.2 meter 50 Ohm BNC to BNC cable kit View Datasheet 2601B-PULSE-CA2 2601B-PULSE 3 meter 50 Ohm BNC to BNC cable kit View Datasheet 2601B-PULSE-CA3 2601B-PULSE 3.0 meter 15 Ohm BNC to BNC cable kit View Datasheet 4299-1 HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT View Datasheet 4299-2 HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS View Datasheet 7078-TRX-GND 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED) View Datasheet 8101-PIV PIV DEMO FIXTURE View Datasheet KPCI-488LPA LOW PROFILE IEEE-488 INTERFACE BOARD View Datasheet KUSB-488B IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER Need more help? Talk to us Call Us Questions? Call our expert team five days a week, M-F. 400-820-5835 Contact US Contact us with comments, questions, or feedback Contact Information Chat Live Chat with Tek representatives. Available 6:00 AM – 4:30 PM PST. Chat Now

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